SciAps X-50 XRF Analyzer
The SciAps X-50, most competitive portable X-Ray Fluorescence (XRF) analyzer, uses the proven, reliable and competitive technology of PiN diode detectors. For many applications such as basic sorting of stainless steel, refractories and copper alloys, or analyzing heavy metals in soils, ores, powders, gold, precious metals, etc., the PiN technology is perfectly suited. The X-50 allow to measure all the needed elements for currents applications. The X-50 presents a very attractive price for routine applications.
Applications
Same element suite as the X-100, but with older PiN diode detector technology. Test times will be much longer to achieve the same precision as X-100, but X-50 platform lower priced.
Great for sorting most SS, high temps, red metals in 3-5 seconds
Basic sorting of SS, high temps and red metals. Only sort Al alloys by MLC’s and 2000’s and 7000’s.
Specs & Applications
Excitation Source: 6-40kV, 200uA Rh anode for alloy testing, 6-50kV, 200uA Au anode for most other Apps.
Detector: 20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.
X-Ray Filtering: 6 position filter wheel for beam optimisation.
Processing Electronics Host Processor: ARM Cortex -A9 dual-core / 1.2GHz Memory: 1GB DDR2 RAM, 1GB NAND Results Storage: 8GB SD
Features
Excitation source : 6-40KV, 200µa with anode Rh for alloys – 6-40Kv, 200µA xith anode Au for Geochem, soils,and other
Detector : SiPin standard with active area 7 mm2, 15 K cps/s à 50%
Weight : 3.3 lbs with battery
Dimensions : 7.25″ x 10.5″ x 4.5″
Internal shutter is also 316 stainless for totally automated calibration and energy scale validation.
X-Ray Filtering : 6 position filter wheel for beam optimization.
Integrated camera, video, and the Android OS platform.
Environmental Temp. Range : 10°F to 130°F at 25% duty cycle.
Transfert data by Wifi, BT, USB
Calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user defined empirical calibrations.
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