Oxford Maxxi-6 Coating Thickness Measurement
For consistent production and high product quality Coating thickness measurement, based on X-ray fluorescence (XRF), is a widely accepted and industry-proven analytical technique, offering easy to use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table. With superior resolution and high efficiency SDD, the MAXXI 6 is the ideal instrument for measuring the thinnest coatings and element composition at trace level.
Key features
• Micro-focus Be window X-ray tube combines high precision, short measurement time with field-proven high reliability,
outstanding product life expectancy and low cost of ownership
• Superior resolution Silicon Drift Detector (SDD) offers optimal efficiency at all energy levels with improved limits of detection (LOD)
• Multi collimator optimizes flux generation, enhancing measurement throughput
• Giant slotted chamber design with generous interior
volume, ideal for a big variety of standard and oversized
samples
• The “USB easy choice” allows operation using a standard
computer through USB connection with no additional
hardware or firmware
• Made in Germany to the highest engineering standards,
robust design for long term reliability
• Approved by PTB (Physikalisch Technische Bundesanstalt),
ensures highest level of radiation safety
Performance and compliance
• Made-In-Germany ensures the highest quality
and reliability
• PTB approval ensures the highest level of radiation safety
• Measurement methods according to ISO 3497, ASTM
B568, DIN 50987, IEC 62321
Giant slotted chamber
• Programmable XY stage
• Internal volume (w x d x h): 500 mm x 450 mm x 170 mm
• Innovative crash protection design
Programmable stage
• Easy load feature with prepositioning laser
• Maximized table travel range and speed
• Automated measurement
Software and calibration
• Intuitive Windows 7 based MaxxControl software
• Choice of empirical calibrations for highest accuracy or FP
model for easy calibration
• Free selection of elements for composition analysis and
free definable layer structure for thickness analysis
• Factory preloaded calibration for RoHS and precious
metals (optional)
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