Bruker S1 Turbo SD-LE Portable XRF Spectrometer
The S1 TURBO SD-LE based on Bruker’s proprietary X-Flash® silicon drift detector (SDD) provides rapid alloy analysis and light element analysis. Provides analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only).
Bruker S1 Turbo SD-LE Portable XRF Spectrometer
General
| Manufacturer | Bruker Corporation | |
| Product Name | S1 Turbo SD-LE | |
| Detection Category | Chemical; Explosives | |
| Detection Principle | Elemental Analysis; | |
| Detection Method | X-ray Fluorescence ; | |
| Application | Emergency Response; Screening; Bulk Analysis; | |
| Equipment Type | Instrument | |
| Product Synopsis | Based on Bruker’s proprietary X-Flash® silicon drift detector (SDD) provides rapid alloy analysis and light element analysis. Provides analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only). | |
| Availability | DISCONTINUED | |
| Technology Readiness Level (TRL) | 9 | |
| User Feedback Sources | Indifferent/No user feedback |
Physical Parameters
| Dimensions | 11.8 x 3.9 x 11 in (300 x 100 x 280 mm) | |
| Weight | <5 Lbs.; 4.49 Lbs. (2 kg) with batteries 3.9 Lbs. (1.77 kg) without batteries | |
| Power Requirements | Lithium Battery; AC/DC Line Power; Li-ion (6 hr. operating time) AC Adapter: Optional | |
| Noise Produced | Negligible |
Logistical Parameters
| Transportability | Handheld | |
| Ruggedness | None; Not militarized, drop sensitive | |
| Operating Conditions | –10 to 50°C (14 to 122°F) | |
| Consumables | None | |
| Solvents/Reagents | None | |
| Calibration Schedule | Factory calibrated with 31 or 36 elements | |
| Communications Interface | ActiveSync via USB or wireless Bluetooth Memory Card | |
| Shelf Life | >5 years |
Operational Parameters
| Other Chemical Targets | Elemental analysis | |
| Adaptability | No; cannot detect or add new targets | |
| Sample Introduction | Solid | |
| Start Up Time (From Cold Start To Sample Ready) | 15 minutes | |
| Response Time (Sample Application To Output) | <5 minutes; 2 minutes | |
| Alarm Capability | Pass/Fail option | |
| Software Control | Yes | |
| Other Operational Parameters | 10 mm2 X-Flash SDD Detector, Peltier cooled; typical resolution 145 eV @ 100,000 cps X-ray tube with Ag target |
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